Product ID:  C112
Date Of Manufacture:   2002





Product Details:

100 Mhz, 80 digital channels

 2 VHF Dig, VHFAWG400A

 VHFAWG400A Differential CC

 U wave6000 Modulated

 Fully integrated analog and digital instrumentation

 Mixed-signal/SOC digital with data rates to 400 Mbps

 Full Spectrum AC instrumentation

 Catalyst's parallel computer architecture reduces overall test time

 IMAGE programming system with interactive debug displays and complete test engineering tools for device characterization

 System architecture that accelerates test development and high-volume production for ICs with complex digital, embedded memory, and high-performance analog components

Model Specifications:

Teradyne Catalyst

With full spectrum instrumentation, broad configurability, and multi-site test, the Catalyst test system delivers full test coverage for a wide range of semiconductor applications, including xDSL, wireless/RF, networking, and power management. And with the Teradyne Tiger�?�?�?�¢?�?�?�?�¢ test system, the Catalyst family extends its range to more pins and Gigahertz speed.

Some Features
(Refer to Confsim File in Inspection Report for exact config)
Fully integrated analog and digital instrumentation

Mixed-signal/SOC digital with data rates to 400 Mbps

Full Spectrum AC instrumentation

• Background-DSP processing - Catalyst's parallel computer architecture reduces overall test time

IMAGE programming system with interactive debug displays and complete test engineering tools for device characterization

System architecture that accelerates test development and high-volume production for ICs with complex digital, embedded memory, and high-performance analog components

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