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TK1186 - Takaya APT-820S Flying Probe Tester (2007)

TK1186 - Takaya APT-820S Flying Probe Tester (2007)

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TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007) TK1186 - Takaya APT-820S Flying Probe Tester (2007)
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Brand: Takaya
Product Code: APT-820S Flying Probe Tester
Availability: In Stock
Price: $0.00
Ex Tax: $0.00

Takaya APT-820S Flying Probe Tester

Model: APT-820S
Type: Fixtureless Tester APT-820S Series
Version 2.0-2 (Compiled 13/08/16)
Year of Manufacture: 2007
Serial number: V7F56002
Protection: IP-4X
Windows 7 Enterprise
2 movable probes for medium board sizes up to 255 mm x 330 mm
Voltage: 220V, AC, Single Phase, 50/60 Hz
Power: 2.0 kVA
Total number of operating days: 2741
Total time in operation: 58220: 38: 53
Total time in Test Menu: 33360: 40: 45
Total test time: 415: 47:17
Made in Japan

100% inspection by a in-line test system for the boards with relatively low number of components.
100% inspection by using multiple in-line systems for medium production volume batches.
Process control test following the pick and place machines.
Random sampling test in mass production line (for quality assurance).
Inspection of additional production (after the product is discontinued).
Inspection of specific area on the boards where they have higher rate of assembly faults.
Inspection of the assembly faults (i.e. SHORT/OPEN error by micro-solder) that AOI are hard to detect.
Analysis of the faulty boards that failed functional test.
Analysis of the faulty boards returned for repair.

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